Mostra el registre parcial de l'element
dc.contributor.author | Trzeciakowski, Witold | |
dc.contributor.author | Martínez Pastor, Juan Pascual | |
dc.contributor.author | Cantarero Sáez, Andrés | |
dc.date.accessioned | 2010-06-08T09:57:31Z | |
dc.date.available | 2010-06-08T09:57:31Z | |
dc.date.issued | 1997 | |
dc.identifier.citation | TRZECIAKOWSKI, Witold ; MARTÍNEZ PASTOR, Juan ; CANTARERO, Andrés. High accuracy Raman measurements using the Stokes and anti-Stokes lines. En: Journal of Applied Physics, 1997, vol. 82, no. 8 | en |
dc.identifier.uri | http://hdl.handle.net/10550/12872 | |
dc.description.abstract | We show that by measuring the separation between the Stokes and anti-Stokes peaks excited by two different laser lines we obtain a very precise determination of absolute phonon energies. The method is useful for measuring small changes of these energies with strain, temperature, laser power, etc. It doubles the changes and avoids the necessity of using the reference lines in the Raman spectra. The method can be applied for the determination of phonon deformation potentials, for the characterization of strained heteroepitaxial layers, and for micro-Raman analysis of strain in silicon integrated circuits. We give examples of phonon shifts in Si, Ge, GaAs, InAs, and GaP as a function of applied biaxial strain, laser power, and temperature. | en_US |
dc.language.iso | en | en |
dc.subject | Silicon ; Germanium ; Elemental Semiconductors ; Gallium Arsenide ; Indium Compounds ; Gallium Compounds ; III-V Semiconductors ; Raman Spectra ; Phonon Spectra ; Semiconductor Epitaxial Layers ; Integrated Circuit Technology ; Deformation ; Laser Beam Effects ; Thermo-Optical Effects | en |
dc.title | High accuracy Raman measurements using the Stokes and anti-Stokes lines | en |
dc.type | journal article | es_ES |
dc.subject.unesco | UNESCO::FÍSICA | en |
dc.identifier.doi | 10.1063/1.366537 | en |
dc.type.hasVersion | VoR | es_ES |
dc.identifier.url | http://scitation.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=JAPIAU000082000008003976000001&idtype=cvips&prog=normal&doi=10.1063/1.366537 | en |