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Mapping electron beam injected trapped charge with scattering scanning near-field optical microscopy

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Mapping electron beam injected trapped charge with scattering scanning near-field optical microscopy

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dc.contributor.author	Tranca, Denis E.
dc.contributor.author	Sánchez Ortiga, Emilio
dc.contributor.author	Saavedra Tortosa, Genaro
dc.contributor.author	Martínez Corral, Manuel
dc.contributor.author	Tofail, Syed A.M.
dc.contributor.author	Stanciu, Stefan G.
dc.contributor.author	Hristu, Radu
dc.contributor.author	Stanciu, George A.
dc.date.accessioned	2017-05-25T16:01:27Z
dc.date.available	2017-05-25T16:01:27Z
dc.date.issued	2016
dc.identifier.citation	Tranca, Denis E. Sánchez Ortiga, Emilio Saavedra Tortosa, Genaro Martínez Corral, Manuel Tofail, Syed A.M. Stanciu, Stefan G. Hristu, Radu Stanciu, George A. 2016 Mapping electron beam injected trapped charge with scattering scanning near-field optical microscopy Optics Letters 41 5 1046 1049
dc.identifier.uri	http://hdl.handle.net/10550/58655
dc.description.abstract	Scattering scanning near-field optical microscopy (s-SNOM) has been demonstrated as a valuable tool for mapping the optical and optoelectronic properties of materials with nanoscale resolution. Here we report experimental evidence that trapped electric charges injected by an electron beam at the surface of dielectric samples affect the sample-dipole interaction, which has direct impact on the s-SNOM image content. Nanoscale mapping of the surface trapped charge holds significant potential for the precise tailoring of the electrostatic properties of dielectric and semiconductive samples, such as hydroxyapatite, which has particular importance with respect to biomedical applications. The methodology developed here is highly relevant to semiconductor device fabrication as well.
dc.language.iso	eng
dc.relation.ispartof	Optics Letters, 2016, vol. 41, num. 5, p. 1046-1049
dc.subject	Òptica Aparells i instruments
dc.subject	Microscòpia
dc.title	Mapping electron beam injected trapped charge with scattering scanning near-field optical microscopy
dc.type	journal article	es_ES
dc.date.updated	2017-05-25T16:01:27Z
dc.identifier.doi	10.1364/OL.41.001046
dc.identifier.idgrec	110737
dc.rights.accessRights	open access	es_ES