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Hybrid multiple diffraction in semipolar wurtzite materials: (0112)-oriented ZnMgO/ZnO heterostructures as an illustration

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Hybrid multiple diffraction in semipolar wurtzite materials: (0112)-oriented ZnMgO/ZnO heterostructures as an illustration

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dc.contributor.author	de Prado Fernández, Esther Luisa
dc.contributor.author	Martínez Tomás, María del Carmen
dc.contributor.author	Deparis, Christiane
dc.contributor.author	Muñoz Sanjosé, Vicente
dc.contributor.author	Zúñiga Pérez, Jesús
dc.date.accessioned	2019-06-19T13:21:21Z
dc.date.available	2019-06-19T13:21:21Z
dc.date.issued	2017
dc.identifier.citation	de Prado Fernández, Esther Luisa Martínez Tomás, María del Carmen Deparis, Christiane Muñoz Sanjosé, Vicente Zúñiga Pérez, Jesús 2017 Hybrid multiple diffraction in semipolar wurtzite materials: (0112)-oriented ZnMgO/ZnO heterostructures as an illustration Journal of Applied Crystallography 50 4 1165 1173
dc.identifier.uri	https://hdl.handle.net/10550/70561
dc.description.abstract	X-ray diffraction has been widely used to characterize the structural properties (strain and structural quality) of semiconductor heterostructures. This work employs hybrid multiple diffraction to analyze r-oriented Zn1xMgxO layers grown by molecular beam epitaxy on ZnO substrates. In such a low-symmetry material system, additional features appear in symmetric reflection scans, which are described as arising from hybrid multiple diffraction. First, the Bragg conditions necessary for these high-order processes to occur are introduced and applied to explain all the observed satellite reflections, identify the planes that contribute and compute a priori the angles at which they are observed. Furthermore, thanks to this hybrid multiple-diffraction technique, it is possible to determine the layer lattice parameters (in-plane and out-of-plane) in an easy and accurate way by using one single measurement in standard symmetric conditions. The achieved precision is at least as high as that obtained from the combination of symmetric and asymmetric reciprocal space map measurements.
dc.language.iso	eng
dc.relation.ispartof	Journal of Applied Crystallography, 2017, vol. 50, num. 4, p. 1165-1173
dc.subject	Cristalls
dc.title	Hybrid multiple diffraction in semipolar wurtzite materials: (0112)-oriented ZnMgO/ZnO heterostructures as an illustration
dc.type	journal article	es_ES
dc.date.updated	2019-06-19T13:21:21Z
dc.identifier.doi	10.1107/S1600576717008524
dc.identifier.idgrec	123607
dc.rights.accessRights	open access	es_ES