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Fast and robust phase-shift estimation in two-dimensional structured illumination microscopy

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Fast and robust phase-shift estimation in two-dimensional structured illumination microscopy

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dc.contributor.author	Sola Pikabea, Jorge
dc.contributor.author	García Rius, Arcadi
dc.contributor.author	Saavedra Tortosa, Genaro
dc.contributor.author	García Sucerquia, Jorge Iván
dc.contributor.author	Martínez Corral, Manuel
dc.contributor.author	Sánchez Ortiga, Emilio
dc.date.accessioned	2019-09-17T13:35:23Z
dc.date.available	2019-09-17T13:35:23Z
dc.date.issued	2019
dc.identifier.citation	Sola Pikabea, Jorge García Rius, Arcadi Saavedra Tortosa, Genaro García Sucerquia, Jorge Iván Martínez Corral, Manuel Sánchez Ortiga, Emilio 2019 Fast and robust phase-shift estimation in two-dimensional structured illumination microscopy Plos One 14 8 e0221254
dc.identifier.uri	https://hdl.handle.net/10550/71543
dc.description.abstract	A method of determining unknown phase-shifts between elementary images in two-dimensional Structured Illumination Microscopy (2D-SIM) is presented. The proposed method is based on the comparison of the peak intensity of spectral components. These components correspond to the inherent structured illumination spectral content and the residual compo- nent that appears from wrongly estimated phase-shifts. The estimation of the phase-shifts is carried out by finding the absolute maximum of a function defined as the normalized peak intensity difference in the Fourier domain. This task is performed by an optimization method providing a fast estimation of the phase-shift. The algorithm stability and robustness are tested for various levels of noise and contrasts of the structured illumination pattern. Furthermore, the proposed approach reduces the number of computations compared to other existing techniques. The method is supported by the theoretical calculations and validated by means of simulated and experimental results.
dc.language.iso	eng
dc.relation.ispartof	Plos One, 2019, vol. 14, num. 8, p. e0221254
dc.subject	Microscòpia
dc.subject	Fourier, Anàlisi de
dc.subject	Imatges Processament Tècniques digitals
dc.title	Fast and robust phase-shift estimation in two-dimensional structured illumination microscopy
dc.type	journal article	es_ES
dc.date.updated	2019-09-17T13:35:23Z
dc.identifier.doi	10.1371/journal.pone.0221254
dc.identifier.idgrec	134175
dc.rights.accessRights	open access	es_ES