NAGIOS: RODERIC FUNCIONANDO

Temperature-Dependent Dynamic on Resistance in Gamma-Irradiated AlGaN/GaN Power HEMTs

Repositori DSpace/Manakin

IMPORTANT: Aquest repositori està en una versió antiga des del 3/12/2023. La nova instal.lació está en https://roderic.uv.es/

Temperature-Dependent Dynamic on Resistance in Gamma-Irradiated AlGaN/GaN Power HEMTs

Mostra el registre parcial de l'element

dc.contributor.author Maset Sancho, Enrique
dc.contributor.author Martínez, Pedro J.
dc.contributor.author Sanchis Kilders, Esteban
dc.contributor.author Gilabert Palmer, David
dc.date.accessioned 2023-11-22T15:12:09Z
dc.date.available 2023-11-22T15:12:09Z
dc.date.issued 2022
dc.identifier.uri https://hdl.handle.net/10550/91332
dc.description.abstract Dynamic RON is a key parameter in terms of device reliability and the efficiency of power-switching converters. In this study, commercial off-the-shelf GaN-on-Si power high-electron-mobility transistors (HEMTs) were irradiated using different regimes of accumulative gamma rays with a 60Co source of photon energy (1.33 MeV), while a base temperature of 53 °C and 133 °C during the irradiation test was applied. This test campaign had the objective of investigating how the combination of gamma irradiation and temperature affects dynamic on-resistance (RON) behaviour. The results indicated that gate voltage bias stress affected the degradation of dynamic on-resistance when irradiation was applied, and that temperature was an accelerating factor in dynamic on-resistance degradation. Finally, we obtained a partial reduction in dynamic RON when a total ionising dose of around 140 krad(SiO2) was applied and the base temperature during the irradiation test was not high.
dc.language.iso eng
dc.relation.ispartof Applied Sciences-Basel, 2022, vol. 12, num. 22, p. 1-14
dc.source Maset E, Martín-Holgado P, Morilla Y, Gilabert D, Sanchis-Kilders E, Martínez PJ. Temperature-Dependent Dynamic on Resistance in Gamma-Irradiated AlGaN/GaN Power HEMTs. Applied Sciences. 2022; 12(22):11578. https://doi.org/10.3390/app122211578
dc.subject enginyeria elèctrica
dc.title Temperature-Dependent Dynamic on Resistance in Gamma-Irradiated AlGaN/GaN Power HEMTs
dc.type journal article
dc.date.updated 2023-11-22T15:12:10Z
dc.identifier.doi 10.3390/app122211578
dc.identifier.idgrec 155926
dc.rights.accessRights open access

Visualització       (4.587Mb)

Aquest element apareix en la col·lecció o col·leccions següent(s)

Mostra el registre parcial de l'element

Cerca a RODERIC

Cerca avançada

Visualitza

Estadístiques