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Evidence of dynamic-R on degradation on low-dose 60Co gamma radiation AlGaN/GaN HEMTs

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Evidence of dynamic-R on degradation on low-dose 60Co gamma radiation AlGaN/GaN HEMTs

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dc.contributor.author	Martínez, Pedro J.
dc.contributor.author	Maset Sancho, Enrique
dc.contributor.author	Gilabert Palmer, David
dc.contributor.author	Sanchis Kilders, Esteban
dc.contributor.author	Ejea Martí, Juan Bautista
dc.date.accessioned	2023-11-24T15:28:07Z
dc.date.available	2023-11-24T15:28:07Z
dc.date.issued	2018
dc.identifier.uri	https://hdl.handle.net/10550/91427
dc.description.abstract	Wide band gap semiconductors are expected to be the future technology for power semiconductors that can enable the reduction of power consumption in many applications. But, in order to use these materials, it is necessary to study their reliability. Regarding its possible use in radioactive environments, it is essential to know the response of HEMT structures based on GaN under radiation. This paper is focused on the study of the effects of gamma radiation on dynamic performance of commercial GaN HEMTs. A test campaign was performed to detect variations on dynamic on-resistance induced by irradiation, due to the relevance of dynamic resistance behavior in power switching converters. This study demonstrates an increase of the dynamic resistance in MISHEMTs structures when they are under gamma radiation together with a voltage stress in the drain region. This increase takes place especially after a hard- switching transition due to the hot-electron effect that takes place during the switching events and can not only lead to an increase of the power losses, but also a reduction in the life time of the device due to the permanent degradation that could be induced by the hot-electron effect.
dc.language.iso	eng
dc.relation.ispartof	Semiconductor Science and Technology, 2018, vol. 33, num. 11, p. 1-7
dc.source	Martínez, Pedro J., Maset Sancho, Enrique, Gilabert Palmer, David, Sanchis Kilders, Esteban, Ejea Martí, Juan Bautista (2018) Evidence of dynamic-R on degradation on low-dose 60Co gamma radiation AlGaN/GaN HEMTs. Semiconductor Science and Technology 33 11 1 7. https://doi.org/10.1088/1361-6641/aae616
dc.subject	enginyeria elèctrica
dc.subject	radiació
dc.title	Evidence of dynamic-R on degradation on low-dose 60Co gamma radiation AlGaN/GaN HEMTs
dc.type	journal article
dc.date.updated	2023-11-24T15:28:07Z
dc.identifier.doi	10.1088/1361-6641/aae616
dc.identifier.idgrec	132449
dc.rights.accessRights	open access