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Charge injection and trapping at perovskite interfaces with organic hole transporting materials of different ionization energies

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Charge injection and trapping at perovskite interfaces with organic hole transporting materials of different ionization energies

dc.contributor.author	Droseros, Nikolaos
dc.contributor.author	Dänekamp, Benedikt
dc.contributor.author	Tsokkou, Demetra
dc.contributor.author	Boix, Pablo P.
dc.contributor.author	Banerji, Natalie
dc.date.accessioned	2020-03-06T15:18:31Z
dc.date.available	2020-03-06T15:18:31Z
dc.date.issued	2019
dc.identifier.citation	Droseros, Nikolaos Dänekamp, Benedikt Tsokkou, Demetra Boix, Pablo P. Banerji, Natalie 2019 Charge injection and trapping at perovskite interfaces with organic hole transporting materials of different ionization energies Apl Materials 7 041115-1 041115-8
dc.identifier.uri	https://hdl.handle.net/10550/73443
dc.description.abstract	The extraction of photogenerated holes from CH3NH3PbI3 is crucial in perovskite solar cells. Understanding the main parameters that influence this process is essential to design materials and devices with improved efficiency. A series of vacuum deposited hole transporting materials (HTMs) of different ionization energies, used in efficient photovoltaic devices, are studied here by means of femtosecond transient absorption spectroscopy. We find that ultrafast charge injection from the perovskite into the different HTMs (<100 fs) competes with carrier thermalization and occurs independently of their ionization energy. Our results prove that injection takes place from hot states in the valence band making this efficient even for HTMs with higher ionization energy than that of the perovskite. Moreover, a new trapping mechanism is observed after the addition of HTMs, which is attributed to interfacial electron traps formed between the CH3NH3PbI3 and the HTMs, in addition to traps in the neat perovskite. Interfacial electron trapping is slower compared to the ultrafast hole injection, which contributes to the high efficiency obtained when these HTMs are employed in solar cells.
dc.language.iso	eng
dc.relation.ispartof	Apl Materials, 2019, vol. 7, p. 041115-1-041115-8
dc.subject	Semiconductors
dc.subject	Materials
dc.title	Charge injection and trapping at perovskite interfaces with organic hole transporting materials of different ionization energies
dc.type	journal article	es_ES
dc.date.updated	2020-03-06T15:18:31Z
dc.identifier.doi	10.1063/1.5086692
dc.identifier.idgrec	136685
dc.rights.accessRights	open access	es_ES